Status: current, Not sufficiently defined by necessary conditions definition status (core metadata concept). Date: 31-Jan 2002. Module: SNOMED CT core
Descriptions:
Id | Description | Lang | Type | Status | Case? | Module |
52243015 | Electron microscopy scanning technique, complete | en | Synonym (core metadata concept) | Active | Entire term case insensitive (core metadata concept) | SNOMED CT core |
762326014 | Electron microscopy scanning technique, complete (procedure) | en | Fully specified name | Active | Entire term case insensitive (core metadata concept) | SNOMED CT core |
Outbound Relationships | Type | Target | Active | Characteristic | Refinability | Group | Values |
Electron microscopy scanning technique, complete | Is a | Scanning electron microscopy study | true | Inferred relationship | Some | ||
Electron microscopy scanning technique, complete | Method | Investigation - action | false | Inferred relationship | Some | ||
Electron microscopy scanning technique, complete | Method | Microscopy - action | false | Inferred relationship | Some | ||
Electron microscopy scanning technique, complete | Has intent | Diagnostic intent (qualifier value) | false | Inferred relationship | Some | ||
Electron microscopy scanning technique, complete | Component | Specimen observable (observable entity) | false | Inferred relationship | Some | ||
Electron microscopy scanning technique, complete | Method | Inspection - action | false | Inferred relationship | Some | 1 | |
Electron microscopy scanning technique, complete | Direct device | Microscope | false | Inferred relationship | Some | ||
Electron microscopy scanning technique, complete | Using | Microscope | false | Inferred relationship | Some | 1 | |
Electron microscopy scanning technique, complete | Using device (attribute) | Microscope | false | Inferred relationship | Some | 1 | |
Electron microscopy scanning technique, complete | Using device (attribute) | Microscope | false | Inferred relationship | Some | 1 | |
Electron microscopy scanning technique, complete | Method | Inspection - action | true | Inferred relationship | Some | 1 | |
Electron microscopy scanning technique, complete | Using device (attribute) | Electron microscope | true | Inferred relationship | Some | 1 |
Inbound Relationships | Type | Active | Source | Characteristic | Refinability | Group |
This concept is not in any reference sets