Status: current, Not sufficiently defined by necessary conditions definition status. Date: 31-Jan 2002. Module: SNOMED CT core module
Descriptions:
Id | Description | Lang | Type | Status | Case? | Module |
134999018 | Electron microscopy study, scanning, with X-ray analysis, examination and report | en | Synonym | Active | Only initial character case insensitive | SNOMED CT core module |
822644014 | Electron microscopy study, scanning, with X-ray analysis, examination and report (procedure) | en | Fully specified name | Active | Only initial character case insensitive | SNOMED CT core module |
Outbound Relationships | Type | Target | Active | Characteristic | Refinability | Group | Values |
Electron microscopy study, scanning, with X-ray analysis, examination and report | Is a | Scanning electron microscopy study | true | Inferred relationship | Existential restriction modifier | ||
Electron microscopy study, scanning, with X-ray analysis, examination and report | Has intent | Diagnostic intent | false | Inferred relationship | Existential restriction modifier | ||
Electron microscopy study, scanning, with X-ray analysis, examination and report | Method | Microscopy - action | false | Inferred relationship | Existential restriction modifier | ||
Electron microscopy study, scanning, with X-ray analysis, examination and report | Method | Investigation - action | false | Inferred relationship | Existential restriction modifier | ||
Electron microscopy study, scanning, with X-ray analysis, examination and report | Component | Specimen observable | false | Inferred relationship | Existential restriction modifier | ||
Electron microscopy study, scanning, with X-ray analysis, examination and report | Method | Inspection - action | false | Inferred relationship | Existential restriction modifier | 1 | |
Electron microscopy study, scanning, with X-ray analysis, examination and report | Direct device | Microscope, device | false | Inferred relationship | Existential restriction modifier | ||
Electron microscopy study, scanning, with X-ray analysis, examination and report | Using | Microscope, device | false | Inferred relationship | Existential restriction modifier | 1 | |
Electron microscopy study, scanning, with X-ray analysis, examination and report | Using device | Microscope, device | false | Inferred relationship | Existential restriction modifier | 1 | |
Electron microscopy study, scanning, with X-ray analysis, examination and report | Using device | Microscope, device | false | Inferred relationship | Existential restriction modifier | 1 | |
Electron microscopy study, scanning, with X-ray analysis, examination and report | Method | Inspection - action | true | Inferred relationship | Existential restriction modifier | 1 | |
Electron microscopy study, scanning, with X-ray analysis, examination and report | Using device | Electron microscope | true | Inferred relationship | Existential restriction modifier | 1 |
Inbound Relationships | Type | Active | Source | Characteristic | Refinability | Group |
This concept is not in any reference sets