Status: current, Not sufficiently defined by necessary conditions definition status (core metadata concept). Date: 31-Jan 2002. Module: SNOMED CT core
Descriptions:
| Id | Description | Lang | Type | Status | Case? | Module |
| 168028018 | Scanning electron microscopy study | en | Synonym (core metadata concept) | Active | Entire term case insensitive (core metadata concept) | SNOMED CT core |
| 559378012 | Scanning electron microscopy study (procedure) | en | Fully specified name | Active | Entire term case insensitive (core metadata concept) | SNOMED CT core |
| 4104251000005113 | scanningselektronmikroskopi | da | Synonym (core metadata concept) | Active | Entire term case insensitive (core metadata concept) | Danish module (core metadata concept) |
| Outbound Relationships | Type | Target | Active | Characteristic | Refinability | Group | Values |
| Scanning electron microscopy study (procedure) | Is a | Electron microscopic study | true | Inferred relationship | Some | ||
| Scanning electron microscopy study (procedure) | Method | Microscopy - action | false | Inferred relationship | Some | ||
| Scanning electron microscopy study (procedure) | Has intent | Diagnostic intent (qualifier value) | false | Inferred relationship | Some | ||
| Scanning electron microscopy study (procedure) | Method | Investigation - action | false | Inferred relationship | Some | ||
| Scanning electron microscopy study (procedure) | Component | Specimen observable (observable entity) | false | Inferred relationship | Some | ||
| Scanning electron microscopy study (procedure) | Method | Inspection - action | false | Inferred relationship | Some | 1 | |
| Scanning electron microscopy study (procedure) | Direct device | Microscope | false | Inferred relationship | Some | ||
| Scanning electron microscopy study (procedure) | Using | Microscope | false | Inferred relationship | Some | 1 | |
| Scanning electron microscopy study (procedure) | Using device (attribute) | Microscope | false | Inferred relationship | Some | 1 | |
| Scanning electron microscopy study (procedure) | Using device (attribute) | Microscope | false | Inferred relationship | Some | 1 | |
| Scanning electron microscopy study (procedure) | Method | Inspection - action | true | Inferred relationship | Some | 1 | |
| Scanning electron microscopy study (procedure) | Using device (attribute) | Electron microscope | true | Inferred relationship | Some | 1 |
| Inbound Relationships | Type | Active | Source | Characteristic | Refinability | Group |
| Electron microscopy scanning technique, complete | Is a | True | Scanning electron microscopy study (procedure) | Inferred relationship | Some | |
| Electron microscopy study, scanning, examination and report | Is a | True | Scanning electron microscopy study (procedure) | Inferred relationship | Some | |
| Electron microscopy study, scanning, with X-ray analysis, examination and report | Is a | True | Scanning electron microscopy study (procedure) | Inferred relationship | Some |
This concept is not in any reference sets
FHIR