Status: current, Not sufficiently defined by necessary conditions definition status (core metadata concept). Date: 31-Jan 2002. Module: SNOMED CT core
Descriptions:
| Id | Description | Lang | Type | Status | Case? | Module |
| 134999018 | Electron microscopy study, scanning, with X-ray analysis, examination and report | en | Synonym (core metadata concept) | Active | Only initial character case insensitive (core metadata concept) | SNOMED CT core |
| 822644014 | Electron microscopy study, scanning, with X-ray analysis, examination and report (procedure) | en | Fully specified name | Active | Only initial character case insensitive (core metadata concept) | SNOMED CT core |
| 1735301000052116 | svepelektronmikroskopi, med röntgenanalys, undersökning och rapport | sv | Synonym (core metadata concept) | Active | Entire term case insensitive (core metadata concept) | SNOMED CT Sweden NRC maintained module (core metadata concept) |
| Outbound Relationships | Type | Target | Active | Characteristic | Refinability | Group | Values |
| Electron microscopy study, scanning, with X-ray analysis, examination and report | Is a | Scanning electron microscopy study | true | Inferred relationship | Some | ||
| Electron microscopy study, scanning, with X-ray analysis, examination and report | Has intent | Diagnostic intent (qualifier value) | false | Inferred relationship | Some | ||
| Electron microscopy study, scanning, with X-ray analysis, examination and report | Method | Microscopy - action | false | Inferred relationship | Some | ||
| Electron microscopy study, scanning, with X-ray analysis, examination and report | Method | Investigation - action | false | Inferred relationship | Some | ||
| Electron microscopy study, scanning, with X-ray analysis, examination and report | Component | Specimen observable (observable entity) | false | Inferred relationship | Some | ||
| Electron microscopy study, scanning, with X-ray analysis, examination and report | Method | Inspection - action | false | Inferred relationship | Some | 1 | |
| Electron microscopy study, scanning, with X-ray analysis, examination and report | Direct device | Microscope | false | Inferred relationship | Some | ||
| Electron microscopy study, scanning, with X-ray analysis, examination and report | Using | Microscope | false | Inferred relationship | Some | 1 | |
| Electron microscopy study, scanning, with X-ray analysis, examination and report | Using device (attribute) | Microscope | false | Inferred relationship | Some | 1 | |
| Electron microscopy study, scanning, with X-ray analysis, examination and report | Using device (attribute) | Microscope | false | Inferred relationship | Some | 1 | |
| Electron microscopy study, scanning, with X-ray analysis, examination and report | Method | Inspection - action | true | Inferred relationship | Some | 1 | |
| Electron microscopy study, scanning, with X-ray analysis, examination and report | Using device (attribute) | Electron microscope | true | Inferred relationship | Some | 1 |
| Inbound Relationships | Type | Active | Source | Characteristic | Refinability | Group |
This concept is not in any reference sets
FHIR