Status: current, Not sufficiently defined by necessary conditions definition status (core metadata concept). Date: 31-Jan 2002. Module: SNOMED CT core
Descriptions:
Id | Description | Lang | Type | Status | Case? | Module |
134999018 | Electron microscopy study, scanning, with X-ray analysis, examination and report | en | Synonym (core metadata concept) | Active | Only initial character case insensitive (core metadata concept) | SNOMED CT core |
822644014 | Electron microscopy study, scanning, with X-ray analysis, examination and report (procedure) | en | Fully specified name | Active | Only initial character case insensitive (core metadata concept) | SNOMED CT core |
Outbound Relationships | Type | Target | Active | Characteristic | Refinability | Group | Values |
Electron microscopy study, scanning, with X-ray analysis, examination and report | élément (attribut) | entité observable d'un échantillon (entité observable) | false | Inferred relationship | Some | ||
Electron microscopy study, scanning, with X-ray analysis, examination and report | méthode (attribut) | Inspection - action | false | Inferred relationship | Some | 1 | |
Electron microscopy study, scanning, with X-ray analysis, examination and report | Direct device | Microscope | false | Inferred relationship | Some | ||
Electron microscopy study, scanning, with X-ray analysis, examination and report | Using | Microscope | false | Inferred relationship | Some | 1 | |
Electron microscopy study, scanning, with X-ray analysis, examination and report | est un(e) (attribut) | Scanning electron microscopy study | true | Inferred relationship | Some | ||
Electron microscopy study, scanning, with X-ray analysis, examination and report | Using device (attribute) | Microscope | false | Inferred relationship | Some | 1 | |
Electron microscopy study, scanning, with X-ray analysis, examination and report | Using device (attribute) | Microscope | true | Inferred relationship | Some | 1 | |
Electron microscopy study, scanning, with X-ray analysis, examination and report | méthode (attribut) | Inspection - action | true | Inferred relationship | Some | 1 | |
Electron microscopy study, scanning, with X-ray analysis, examination and report | a pour but (attribut) | à visée diagnostique | false | Inferred relationship | Some | ||
Electron microscopy study, scanning, with X-ray analysis, examination and report | méthode (attribut) | Microscopy - action | false | Inferred relationship | Some | ||
Electron microscopy study, scanning, with X-ray analysis, examination and report | méthode (attribut) | Investigation - action | false | Inferred relationship | Some |
Inbound Relationships | Type | Active | Source | Characteristic | Refinability | Group |
This concept is not in any reference sets