Status: current, Not sufficiently defined by necessary conditions definition status (core metadata concept). Date: 31-Jan 2002. Module: SNOMED CT core
Descriptions:
| Id | Description | Lang | Type | Status | Case? | Module |
| 136321019 | Electron microscopy technique, staining, thick section | en | Synonym (core metadata concept) | Active | Entire term case insensitive (core metadata concept) | SNOMED CT core |
| 823558014 | Electron microscopy technique, staining, thick section (procedure) | en | Fully specified name | Active | Entire term case insensitive (core metadata concept) | SNOMED CT core |
| 3253511000172118 | kleuren van dikke coupe voor elektronenmicroscopie | nl | Synonym (core metadata concept) | Active | Entire term case insensitive (core metadata concept) | Belgian module (core metadata concept) |
| Outbound Relationships | Type | Target | Active | Characteristic | Refinability | Group | Values |
| Electron microscopy technique, staining, thick section | Is a | Electron microscopic study | true | Inferred relationship | Some | ||
| Electron microscopy technique, staining, thick section | Method | Investigation - action | false | Inferred relationship | Some | ||
| Electron microscopy technique, staining, thick section | Has intent | Diagnostic intent (qualifier value) | false | Inferred relationship | Some | ||
| Electron microscopy technique, staining, thick section | Method | Microscopy - action | false | Inferred relationship | Some | ||
| Electron microscopy technique, staining, thick section | Method | Inspection - action | false | Inferred relationship | Some | 1 | |
| Electron microscopy technique, staining, thick section | Direct device | Microscope | false | Inferred relationship | Some | ||
| Electron microscopy technique, staining, thick section | Using | Microscope | false | Inferred relationship | Some | 1 | |
| Electron microscopy technique, staining, thick section | Using device (attribute) | Microscope | false | Inferred relationship | Some | 1 | |
| Electron microscopy technique, staining, thick section | Method | Inspection - action | true | Inferred relationship | Some | 1 | |
| Electron microscopy technique, staining, thick section | Using device (attribute) | Microscope | false | Inferred relationship | Some | 1 | |
| Electron microscopy technique, staining, thick section | Using device (attribute) | Electron microscope | true | Inferred relationship | Some | 1 |
| Inbound Relationships | Type | Active | Source | Characteristic | Refinability | Group |
This concept is not in any reference sets
FHIR